- Packaging :
- Прикладные фильтры :
8 продукты
| ОБРАЗ | ЧАСТЬ №. | ЦЕНА | КОЛИЧЕСТВО | АКЦИИ | ПРОИЗВОДСТВО | ОПИСАНИЕ | Series | Part Status | Packaging | Mounting Type | Applications | Package / Case | Interface | Supplier Device Package | Voltage - Supply | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
ПОСМОТРЕТЬ |
2,462
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Cut Tape (CT) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
3,350
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Tape & Reel (TR) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
3,555
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Cut Tape (CT) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
1,804
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Tape & Reel (TR) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
2,462
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Cut Tape (CT) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
3,350
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Tape & Reel (TR) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
3,555
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Cut Tape (CT) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | ||
|
|
|
ПОСМОТРЕТЬ |
1,804
В наличии
|
Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | SCOPE™, Widebus™ | Obsolete | Tape & Reel (TR) | Surface Mount | Circuit Board Testing | 64-LQFP | 4-Wire Test Access Port (TAP) | 64-LQFP (10x10) | 2.7 V ~ 3.6 V |
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